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2402Accesses 3Citations 1Altmetric 0Mentions

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Effects of Random Nanosized TiN Grain on Characteristic of Gate-All-Around FinFETs with Ferroelectric HZO Layer

Last updated: Fri, 29 Mar 2024 10:29:44 UTC

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2402 Accesses

Citations

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3 Web of Science

2 CrossRef

Altmetric

Altmetric score 1
  • 1 tweeters
  • 2 Mendeley

Altmetric calculates a score based on the online attention an article gets — the higher the score, the more online attention an article has received.

Surrounding the score can be 1 or more colours. Each colour represents a different type of online attention, like social media or news outlets.

Older articles have had more time to get noticed, so Altmetric provides context data for articles of a similar age.

This article is in the 14th percentile (ranked 389,029th) of the 516,280 tracked articles of a similar age in all journals and the 33rd percentile (ranked 4th) of the 6 tracked articles of a similar age in Discover Nano.

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