Table 1 Key Parameters for LIGBTs
From: Snapback-Free Reverse-Conducting SOI LIGBT with an Integrated Self-Biased MOSFET
Parameters | ISM | CON | SSA | STA |
---|---|---|---|---|
SOI layer thickness, ts (μm) | 6 | 6 | 6 | 6 |
Buried oxide thickness, tBOX (μm) | 3 | 3 | 3 | 3 |
N-drift doping, Nd (× 1015 cm−3) | 3.6 | 3.6 | 3.6 | 3.6 |
N-drift length, Ld (μm) | 30 | 30 | 30 | 30 |
N-buffer doping, Nbuffer (× 1017 cm−3) | 2 | 2 | 2 | 2 |
Doping of the N + region in the ISM (× 1018 cm−3) | 1 | – | – | – |
Length of the N + region in the ISM (μm) | 0.6 | – | – | – |
Spacing between trenches, ST (μm) | – | – | – | 0.5 |
Distance between P + and N + anode, Lb (μm) | 1 | – | 40/60 | 5 |