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Fig. 3 | Nanoscale Research Letters

Fig. 3

From: Medium-Temperature-Oxidized GeOx Resistive-Switching Random-Access Memory and Its Applicability in Processing-in-Memory Computing

Fig. 3

Schematic of the switching process of the Ni/GeOx/p+-Si ReRAM device (larger sign denotes larger bias). a Pristine state. b Ni2+ ions (gray circles) move toward the p+ Si bottom electrode and undergoes reduction to form Ni atoms (red circles), by which a conductive filament is formed and grows toward the Ni top electrode. c Conductive filament touches the top electrode (LRS). d Rupture of the conductive filament due to the application of opposite polarity bias voltage (HRS)

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