Fig. 3From: Medium-Temperature-Oxidized GeOx Resistive-Switching Random-Access Memory and Its Applicability in Processing-in-Memory ComputingSchematic of the switching process of the Ni/GeOx/p+-Si ReRAM device (larger sign denotes larger bias). a Pristine state. b Ni2+ ions (gray circles) move toward the p+ Si bottom electrode and undergoes reduction to form Ni atoms (red circles), by which a conductive filament is formed and grows toward the Ni top electrode. c Conductive filament touches the top electrode (LRS). d Rupture of the conductive filament due to the application of opposite polarity bias voltage (HRS)Back to article page