Fig. 5
From: Large Dense Periodic Arrays of Vertically Aligned Sharp Silicon Nanocones
Overlapping cross-sectional SEM and TEM images, in which the transparency of the SEM image is changed from 0 to 100% for both the left-half and right-half of the image. On the left side solely the SEM image is seen, whereas on the right side solely the TEM is observed. A coordinate system is drawn together with visual aids representing sliced vertical conical sections. The scale bars represent 50 nm