Figure 2From: Scanned Probe Oxidation onp-GaAs(100) Surface with an Atomic Force MicroscopyAFM anodic oxidation by the two different types of probes used in this study: (a) Oxide height as a function of the anodization time from 0.01 to 100 s at an anodized voltage of 8 V; (b) Relationship of the growth rate and the electric field strength; and (c) Oxide height vs. the growth rateBack to article page