Figure 3From: Properties of silicon dioxide layers with embedded metal nanocrystals produced by oxidation of Si:Me mixture Transmission electron microscopy analysis from a Si:Pt sample, oxidized at T = 640°C for 5 h in dry O2: bright-field plain-view (a) and high resolution (b) TEM images. Crystalline PtSi NCs exhibit a dark contrast on the gray background of the SiO2 layer.Back to article page