Figure 8From: Growth and characterization of gold catalyzed SiGe nanowires and alternative metal-catalyzed Si nanowires Single NW mechanical characterization. (a) AFM tapping-mode image of a GaN NW. (b) Principle of mechanical measurement on a single NW where w is the NW deflection when a force f is applied at a position a. The cantilever deflection is measured as an indirect measurement of w.Back to article page