Figure 5From: Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy Topography (left) and resistance maps (right) of raw CNTs and CNTs with AuNPs using a diamond tip for various polarizations between ±3 V. The scan length is 1 μm. For the electrical images obtained on CNTs with AuNPs, the resistance scale is plotted in the range of 104 to 106 Ω to enhance the contrast.Back to article page