Figure 3
From: bOptimizing atomic force microscopy for characterization of diamond-protein interfaces
Wear of diamond substrates in contact mode AFM. (a) Two 2 × 2 μm2 CM scans with F = 3 μN were made in the central area using NSG01 tip with k = 3 N/m. Overall image in TM reveal holes with depth h = 20 ± 15 nm. (b) CM nanoshaving (2 × 2 μm2) image of NCD was made in air using NSG01 tip with applied force F = 1.5 μN. Overall image in TM reveal hole with depth h = 6 ± 12 nm. (c) CM nanoshaving (1 × 1 μm2) on MCD surface was made using NSG01 tip with F = 3 μN (k = 3 N/m). Overall image in TM (2 × 2 μm2) reveals absence of any changes on the surface. (d) The model illustrating wear of NCD grains by Si cantilever. CM nanoshaving makes NCD grains more rounded and their Lx values slightly increases. (e) The model illustrates formation of a depression in the NCD surface by the wear of NCD grains during AFM scanning in CM.