Figure 4
From: Growth mechanism and magnon excitation in NiO nanowalls
The X-ray diffraction patterns of the NiO nanowalls. (a-e) X-ray diffraction and Rietveld refinement at various T A; (f) ratio of the integrated intensity of [1 1 1] and [2 0 0] of NiO nanowalls as a function of T A. The ratio of the integrated intensity [1 1 1] and [2 0 0] is noticeably higher than the standard value of 0.74 in bulk NiO bulk (dashed line) at lower T A and closer to the standard value at T A = 800°C.