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Table 1 Nanoparticle radii results of nanoparticle radii simulated measurements for nanoparticles with nominal radius of 30 nm and different surface coverages.

From: Atomic force microscopy analysis of nanoparticles in non-ideal conditions

		σ= 0 nm				σ= 10 nm
	Pow	Min	Lap	Disk	Pow	Min	Lap	Disk
C1, tip 1	32 ± 2	30 ± 1	30 ± 1	30 ± 1	33 ± 1	30 ± 3	30 ± 1	30 ± 1
C1, tip 2	37 ± 7	34 ± 1	34 ± 1	44 ± 2	44 ± 20	33 ± 5	32 ± 4	41 ± 3
C1, tip 3	N. A.	33 ± 3	33 ± 3	52 ± 5	N. A.	34 ± 6	34 ± 5	55 ± 9
C2, tip 1	32 ± 1	30 ± 1	30 ± 1	29 ± 1	33 ± 2	30 ± 2	30 ± 1	30 ± 1
C2, tip 2	38 ± 5	29 ± 3	25 ± 4	36 ± 3	38 ± 4	30 ± 5	28 ± 4	38 ± 6
C2, tip 3	37 ± 6	28 ± 5	22 ± 6	38 ± 3	38 ± 8	26 ± 6	22 ± 7	38 ± 5
C3, tip 1	30 ± 1	30 ± 1	30 ± 7	30 ± 1	31 ± 2	30 ± 2	28 ± 3	30 ± 1
C3, tip 2	31 ± 3	31 ± 2	24 ± 6	34 ± 4	34 ± 2	28 ± 6	23 ± 7	34 ± 5
C3, tip 3	34 ± 5	29 ± 5	21 ± 7	37 ± 5	33 ± 12	23 ± 8	17 ± 9	33 ± 7
C4, tip 1	31 ± 1	N. A.	25 ± 4	29 ± 1	35 ± 5	29 ± 9	22 ± 8	28 ± 2
C4, tip 2	30 ± 1	N. A.	19 ± 6	31 ± 3	31 ± 4	23 ± 12	18 ± 10	30 ± 8
C4, tip 3	29 ± 1	N. A.	16 ± 5	36 ± 4	31 ± 4	N. A.	N. A.	30 ± 9

(C1: 13%, random, C2: 50%, random; C3: 50%, self-organized; C4: 140% self-organized) and different AFM tips (tip1: ideal, tip2: sharpened, tip3: standard; see text for details).
Power spectrum (pow), minimum basis volume (min), Laplacian basis volume (lap) and xy projection (disk) methods were used. All values are in nanometers. Total number of deposited particles was approximately 50 (C1), 180 (C2, C3) and 400 (C4)

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