Figure 1From: Field modulation in Na-incorporated Cu(In,Ga)Se2 (CIGS) polycrystalline films influenced by alloy-hardening and pair-annihilation probabilities XTEM images of each interface. (a) the interface between the CdS buffer; (b) the CIGS absorber layers for the Na-restricted device and the Na-incorporated device; the interface between the CIGS absorber layers and the Mo back contact layers for (c) the Na-restricted device; (d) the Na-incorporated device.Back to article page