Metrics
Developing a theoretical relationship between electrical resistivity, temperature, and film thickness for conductors
Last updated: Fri, 26 Apr 2024 14:50:49 UTC
Accesses
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14k Accesses
Citations
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98 CrossRef
Altmetric
- 1 tweeters
- 233 Mendeley
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This article is in the 8th percentile (ranked 203,278th) of the 248,905 tracked articles of a similar age in all journals and the 9th percentile (ranked 18th) of the 22 tracked articles of a similar age in Discover Nano.
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