Figure 1From: Delayed crystallization of ultrathin Gd2O3 layers on Si(111) observed by in situ X-ray diffractionIn-plane intensity distribution in reciprocal space. (a) Measured and (b) schematic in-plane intensity distribution showing the Gd2O3 bixbyite (blue circles) and substrate (red squares) reflections, and the tails of the CTRs (10L)hex, (20L)hex, and 1 1 ̄ L hex (green triangles).Back to article page