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Table 1 Summary of the AFM statistic analysis of samples

From: Enhanced photoluminescence of multilayer Ge quantum dots on Si(001) substrates by increased overgrowth temperature

Sample Width (nm) Height (nm) Density (1010 m−2)
A 32 ± 5 2.5 ± 0.3 3.8
B 50 ± 8 4.4 ± 0.5 2.4
C 92 ± 10 8.1 ± 1 0.5
30 to 60 2.4 to 5 0.6