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Table 1 Summary of the AFM statistic analysis of samples

From: Enhanced photoluminescence of multilayer Ge quantum dots on Si(001) substrates by increased overgrowth temperature

Sample

Width (nm)

Height (nm)

Density (1010 m−2)

A

32 ± 5

2.5 ± 0.3

3.8

B

50 ± 8

4.4 ± 0.5

2.4

C

92 ± 10

8.1 ± 1

0.5

30 to 60

2.4 to 5

0.6

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