Figure 7
Displacement field within InGaAs QDMs and related X-ray nanodiffraction simulation. (a) shows the vertical slice through the x-component of the displacement field within In0.3Ga0.7As/GaAs QDMs calculated by FEM and the corresponding scattering simulation near the GaAs(004) and InGaAs(004) reflections. (b) shows a comparable slice like that of (a) but after removing all 3D data of the InGaAs QDMs directly before running the scattering simulations shown below. The FEM strain field calculations have been performed before cropping the model data.