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Table 1 Texture analysis data of LZO films grown on three different buffer architectures

From: Fabrication and characterization of La₂Zr₂O₇ films on different buffer architectures for YBa₂Cu₃O_7−δ coated conductors by RF magnetron sputtering

	Out-of-plane texture ∆ ω(deg)		In-plane texture ∆ φ(deg)
	LZO (004) + CeO₂(002)	YSZ (002)	LZO (222) + CeO₂(111)	YSZ (111)
LZO/CeO₂/NiW	3.4		5.5
LZO/YSZ/CeO₂/NiW	3.8	4.2	6.0	7.2
LZO/CeO₂/YSZ/CeO₂/NiW	3.5	4.2	6.1	7.2

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