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Figure 5 | Nanoscale Research Letters

Figure 5

From: Antireflective silicon nanostructures with hydrophobicity by metal-assisted chemical etching for solar cell applications

Figure 5

Hemispherical reflectance spectrum measurement of Si nanostructures. Measured hemispherical reflectance spectra of the corresponding Si nanostructures fabricated using different etching temperatures from 23°C to 40°C in an aqueous solution composed of HNO3, HF, and DI water (4:1:20 v/v/v). The insets show 45° tilted-view SEM images for the corresponding Si nanostructures.

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