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Figure 6 | Nanoscale Research Letters

Figure 6

From: Modification of the optical and structural properties of ZnO nanowires by low-energy Ar+ ion sputtering

Figure 6

HR-TEM images of ZnO NW. (a) HR-TEM image recorded on an irradiated ZnO NW (fluence = 1017 cm−2) confirming the high crystalline quality of the nanowire; the inset shows the corresponding FFT recorded along the [0001] zone axis. (b) HR-TEM micrograph of one individual irradiated ZnO NW (fluence = 1017 cm−2) faceted tip. The inset corresponds to the small squared region of the tip, showing the appearance of one extra plane (edge dislocation).

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