Figure 5From: Absolute flatness measurements of silicon mirrors by a three-intersection method by near-infrared interferometryArrangement of the reference (lower left) and detected (upper right) flats in the three-intersection method. For (a) rotation axis on diagonal, (b) another diagonal, (c) line at y = 10.0 mm, and (d) line at x = 10.0 mm.Back to article page