Figure 1
From: High sensitivity of middle-wavelength infrared photodetectors based on an individual InSb nanowire
SEM image, XRD pattern, TEM and HRTEM images, and EDX spectrum of synthesized InSb nanowires. (a) SEM image shows the well-aligned and dense InSb, in which the image reveals the diameter (200 nm) of the InSb nanowires. (b) XRD pattern of the synthesized InSb nanowires. (c) An HRTEM image of InSb nanowires reveals the preferred growth orientation being along [220]. The inset is a selected area electron diffraction (SAED) image. (d) The enlarged HRTEM image shows the clear lattice spacing of atomic planes. (e) EDX spectrum shows the composition of the synthesized InSb nanowire.