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Figure 8 | Nanoscale Research Letters

Figure 8

From: Dielectric relaxation of high-k oxides

Figure 8

XTEM (a,b), XRD (c), and k- f data (d) of annealed and as-deposited samples. (a) XTEM of annealed La0.09Zr0.91O2 sample. (b) XTEM of annealed La0.35Zr0.65O2 sample. (c) XRD of as-deposited La x Zr 1−x O2−δ. (d) k-f data of as-deposited and annealed La x Zr 1−x O2−δ[52].

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