Figure 3From: Fabrication and characterization of well-aligned plasmonic nanopillars with ultrasmall separationsAFM image, reflectance, and electric field distributions of Au nanopillars. (a) AFM image of Au nanopillars with 450-nm periodicity. (b) Measured reflectance of Au nanopillar arrays with varying incident angles. (c) Calculated side-view (left) and top-view (right) electric field distributions of a nanopillar at 30° incidence at the wavelength of 430 nm.Back to article page