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Table 1 Thickness evolution of the thin films obtained by ISS process

From: A comparative study of two different approaches for the incorporation of silver nanoparticles into layer-by-layer films

Fabrication process	Thickness (nm)	LSPR (λ_max; A_max)
[PAH(9.0)/PAA(9.0)]₄₀	288 ± 5	-
[PAH(9.0)/PAA(9.0)]₄₀ + 1 L/R cycle	291 ± 4	421.3 nm; 0.04
[PAH(9.0)/PAA(9.0)]₄₀ + 2 L/R cycles	289 ± 16	422.1 nm; 0.09
[PAH(9.0)/PAA(9.0)]₄₀ + 3 L/R cycles	296 ± 8	422.8 nm; 0.79
[PAH(9.0)/PAA(9.0)]₄₀ + 4 L/R cycles	294 ± 8	424.6 nm; 1.07

Thickness evolution of the ISS films and the location of the LSPR absorption bands (λ_max) with their maxima absorbance values (A_max).

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