Metrics
Tuning of strain and surface roughness of porous silicon layers for higher-quality seeds for epitaxial growth
Last updated: Fri, 26 Apr 2024 15:34:34 UTC
Accesses
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2105 Accesses
Citations
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18 CrossRef
Altmetric
- 1 tweeters
- 17 Mendeley
Altmetric calculates a score based on the online attention an article gets — the higher the score, the more online attention an article has received.
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This article is in the 14th percentile (ranked 176,863rd) of the 241,394 tracked articles of a similar age in all journals and the 11th percentile (ranked 20th) of the 26 tracked articles of a similar age in Discover Nano.
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