Figure 3From: Total ionizing dose (TID) effects of γ ray radiation on switching behaviors of Ag/AlO x /Pt RRAM deviceResistance distributions of the Ag/AlO x /Pt RRAM devices. Distribution of (a) the initial resistance and (b) the resistance in HRS and LRS of the devices with different radiation doses. A degeneration of the initial resistance and the resistance in HRS occurs for the radiated samples.Back to article page