Figure 2

XRD patterns and grain shape analysis after TT under magnetic field. (a) XRD patterns for all Co-doped SnO₂ thin films deposited at RT and with different thermal treatments, the XRD pattern of the target is also shown. (b) Schematic unit cell of the SnO₂ rutile structure showing different planes. (c) Variation of the order parameter S for all samples; grey blocks represent the suggested grain shape modification, compared to S =1 from a pure SnO₂ crystal.