Figure 5
From: Effect of grain size on thermal transport in post-annealed antimony telluride thin films
Measured out-of-plane total thermal conductivity of the 400-nm-thick Sb 2 Te 3 thin films. (a) Measured total thermal conductivity, κf = κL + κe, of 400-nm-thick Sb2Te3 films annealed at temperatures of 200°C, 250°C, 300°C, 320°C, and 350°C as a function of temperature. (b) Measured total thermal conductivity of film annealed at 300°C as a function of temperature (red in scatter plot). For comparison, the theoretically calculated total thermal conductivity (κ f, solid line in red) with the two components of the thermal conductivity (the electronic (κ e, dotted line in black) and lattice thermal conductivities (κ L, solid line in blue)), are also included. κ e was calculated from the out-of-plane electrical conductivity using the Wiedemann-Franz law.