Figure 6
From: Nano-oxide thin films deposited via atomic layer deposition on microchannel plates
Cross-sectional SEM pictures of ALD-MCP samples deposited on conditions 1, 2, 3, and 4. SEM cross-sectional pictures of ALD-MCP samples deposited on condition 1 (A) with enlargement of the top part (B) and bottom part (C) in a pore and other samples on conditions 2 (D), 3 (E), and 4 (F), respectively.