I-V hysteresis for a Cu/Ge0.3Se0.7/W memory device and typical P/E cycles of a Cu/Ge0.2Se0.8/W memory device. (a)
I-V hysteresis of more than 100 consecutive DC cycles for a Cu/Ge0.3Se0.7/W memory device. The size of the memory device is 4 × 4 μm2. (b) Typical P/E cycles of a Cu/Ge0.2Se0.8/W memory device. Every P/E cycle was recorded. This suggests that the P/E cycles are more than 105.