Fig. 9From: Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy a Ratios of SNOM signals to background signals plotted as a function of the analyzer, and b SNOM images of a Cr pattern on quart substrate measured with various angles of analyzer indicated in (a), 0°, 50°, 130°, 140°, 150°, and 230°Back to article page