Fig. 4From: Facile Preparation of a Platinum Silicide Nanoparticle-Modified Tip Apex for Scanning Kelvin Probe MicroscopySEM, TEM, and SAD results. a, b The SEM images of PSM tips. c, e The TEM images of Pt NP-modified planar silicon after AMA. d, f The SAD pattern from c and e, respectively. The AMA duration was 60 s for a, c, and d and 90 s for b, e and f, respectively. The power of the microwave was 1800 WBack to article page