Fig. 6From: Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger MicroscopyThree Auger maps in 3D representation for Ge content distributions. Fragments of the surfaces of three Auger maps in 3D representation for Ge content distributions recorded in d-cluster at the depths of 8, 17, and 27 nm, correspondinglyBack to article page