Fig. 3From: Polarization memory effect in the photoluminescence of nc-Si−SiOx light-emitting structuresSpectra of the polarization degree for porous of nc-Si−SiOx sample, which were treated in HF solution for 5 (a, b) and 17 (c, d) min. The polarization of the exciting light was oriented parallel to the projection of the inclined SiOx nanocolumns on the sample plane (b, c) and in perpendicular direction (a, d)Back to article page