Fig. 3From: Visible photoassisted room-temperature oxidizing gas-sensing behavior of Sn2S3 semiconductor sheets through facile thermal annealingTEM analyses of the Sn2S3–SnO2 thin film. a Low-magnification cross-sectional TEM image of the film. b HRTEM image taken from the inner region of the film (marked with 1 in a). The region corresponded to the region of Sn2S3 phase. c HRTEM image taken from the outer region of the film (marked with 2 in a). It shows that the SnO2 phase distributed on the outer region of the Sn2S3 phase. d Cross-sectional EDS line-scan profiling spectra of Si, Sn, S, and O elements taken from the film (as shown with a red line in a)Back to article page