Fig. 1From: Analytical Description of Degradation-Relaxation Transformations in Nanoinhomogeneous Spinel CeramicsDegradation testing of RRD ΔR/R 0 caused by prolonged storage at 170°C in Cu0.1Ni0.1Co1.6Mn1.2O4 thick films prepared with screen-printed Ag-Pd contacts (the symbols stand for experimental data and the line represents SER model curve)Back to article page