Fig. 4From: Fabrication and Gas-Sensing Properties of Ni-Silicide/Si NanowiresThe image brightness profiles along the (a) aa′, (b) bb′, (c) cc′, (d) dd′, (e) ee′, (f) ff′, (g) gg′, (h) hh′, and (i) ii′ are shown in Fig. 3, in which the average height of the substrate is 0 nm, for the oxide lines written with 0.39, 1, 2, 3.98, 9.9, 13, 19, 47, and 90 Hz, respectivelyBack to article page