Fig. 1From: Enhanced Dielectric Environment Sensitivity of Surface Plasmon-Polariton in the Surface-Barrier Heterostructures Based on Corrugated Thin Metal Films with Quasi-Anticorrelated InterfacesExperimental spectral dependencies of optical constants: refractive index, n (black line), and exctinction coefficient, k (red line), for chalcogenide photoresist (As40S30Se30) filmBack to article page