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Fig. 6 | Nanoscale Research Letters

Fig. 6

From: Enhanced Dielectric Environment Sensitivity of Surface Plasmon-Polariton in the Surface-Barrier Heterostructures Based on Corrugated Thin Metal Films with Quasi-Anticorrelated Interfaces

Fig. 6

The spatial distribution of the electric field intensity E 2 for wavelength near SPP resonance in vicinity of plasmon-carrying layer with a quasi-anticorrelated interfaces (with trapezoidal ChP wires inclusions) and b correlated interfaces (sinusoidal profiling of a metal film interfaces). The p-polarized light is normally incident on the top of structures. Structure parameters are the same as in Fig. 3

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