Fig. 1
From: Strong Pinned-Spin-Mediated Memory Effect in NiO Nanoparticles
a SEM image of NiO nanoparticles showing the agglomeration behavior. b Histogram of the mean diameter distribution of nanoparticles obtained from the SEM images, where the solid line represents the fitting curve, assuming a log-normal distribution function. c SAED pattern and d Rietveld-refined (red solid line) synchrotron XRD pattern of NiO nanoparticles