Fig. 1From: Photoluminescence Study of the Interface Fluctuation Effect for InGaAs/InAlAs/InP Single Quantum Well with Different ThicknessThe X-ray diffraction results for a the bulk InAlAs and InGaAs reference samples, b the 7-nm InGaAs/InAlAs QW, and c the 15-nm InGaAs/InAlAs QW. The solid curve is the experimental data and the dash curve is the simulation resultsBack to article page