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Fig. 4 | Nanoscale Research Letters

Fig. 4

From: Engineering the Complex-Valued Constitutive Parameters of Metamaterials for Perfect Absorption

Fig. 4

The relative permittivity ε and permeability μ of the metamaterial anti-reflection layer for achieving perfect absorption, with the thickness of the anti-reflection layer d 1 = 15 nm and the thickness of the α-Si:H layer d 2 = 30 nm. The dashed lines give the numerically calculated values of the real and imaginary parts (ε r , ε i , μ r , μ i ) of ε and μ, and the solid lines give the corresponding results (ε r ,, ε i ,, μ r ,, μ i ,) fitted through the Lorentz model

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