Fig. 6From: Infrared, Raman and Magnetic Resonance Spectroscopic Study of SiO2:C NanopowdersThe first derivative of X-band ED EPR spectra measured in SiO2:C samples annealed at 700 °C (upper traces) and 800 °C (lower traces) (a). The X-band Mims pulsed ENDOR spectra measured in SiO2:C samples annealed at 700 °C (upper trace) and 800 °C (lower trace) when the magnetic field was set to the CRR field position. (b). T = 10 KBack to article page