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Table 3 The ΔE _V values of the Al₂O₃/Zn_0.8Al_0.2O heterojunction with Al₂O₃ thickness of 3–5 nm

From: Band Offset Measurements in Atomic-Layer-Deposited Al₂O₃/Zn_0.8Al_0.2O Heterojunction Studied by X-ray Photoelectron Spectroscopy

ΔE _V	3 nm Al₂O₃/Zn_0.8Al_0.2O		4 nm Al₂O₃/Zn_0.8Al_0.2O		5 nm Al₂O₃/Zn_0.8Al_0.2O
ΔE _V	Zn 2p _3/2	Zn 2p _1/2	Zn 2p _3/2	Zn 2p _1/2	Zn 2p _3/2	Zn 2p _1/2
Al 2p	0.9	0.84	0.87	0.91	0.89	0.32
O 1 s	0.87	0.81	0.85	0.89	0.9	0.33

The calculation does not include the italic numbers

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