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Table 2 Performance summary of the new charge splitting in situ recorder (CSIR) for monitoring plasma charging damage in advanced FinFETs BEOL process

From: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

PID detector

Readings

Charge polarity separation

Read-time feedback

Sensitivity control

AR

Conventional

TBD

No

No

Antenna ratio (AR)

>103

CSIR

QFG

Yes

Yes

Coupling ratio (CR)

~102

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