Fig. 1From: Fabrication of Nanoscale Pits with High Throughput on Polymer Thin Film Using AFM Tip-Based Dynamic Plowing Lithography a Schematic of the line scratching process on PMMA film surface with the FSN method. The cantilever is oscillating at its resonance frequency f in the vertical direction. The scratching velocity v is modified along the fast scan direction. Various scratching velocity ranges are depicted: b high scratching velocity, c medium scratching velocity, and d low scratching velocityBack to article page