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Fig. 1 | Nanoscale Research Letters

Fig. 1

From: Fabrication of Nanoscale Pits with High Throughput on Polymer Thin Film Using AFM Tip-Based Dynamic Plowing Lithography

Fig. 1

a Schematic of the line scratching process on PMMA film surface with the FSN method. The cantilever is oscillating at its resonance frequency f in the vertical direction. The scratching velocity v is modified along the fast scan direction. Various scratching velocity ranges are depicted: b high scratching velocity, c medium scratching velocity, and d low scratching velocity

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