Fig. 2From: Preparation and Thermoelectric Characteristics of ITO/PtRh:PtRh Thin Film ThermocoupleX-ray diffraction patterns of ITO thin film annealed in N2-Air. Apart from the peaks of alumina substrate, the diffraction peaks of polycrystalline cubic bixbyite In2O3 phase have been found without preferred orientation. No diffraction peaks of Sn and corresponding oxide/nitride were observed in the XRD patternsBack to article page