Fig. 7From: Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force MicroscopyAFM images of single GO flake on the Ni film: initial (a) and annealed at 180 °C for 15 min (b). Corresponding surface height profiles along dashed lines are shown in (c) and height histograms over images are shown in (d). Peaks positions according to the peak-fit analysis are marked by arrowsBack to article page