Fig. 9From: Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force MicroscopyHalo around flake. Topography map overlapped by corresponding SKPFM contour map of the GO flake on Ni substrate annealed at 140 °C for 15 min (a). Enlarged maps of surrounding halo are shown in (b, c). Numbers denote external (#1), external (#2), edge (#3), and intrinsic (#4) zonesBack to article page