Fig. 1From: Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurementsa 2D-GIXD patterns of the highly crystalline vacuum-deposited DH4T film with overlaid simulated Bragg reflections (red circles) for a monoclinic unit cell. Intensity line profiles measured along q⊥of b 11 ± L and c 12 ± L reflection families are given in purple and green color, respectivelyBack to article page